Semiconductor

Semiconductor Solution

Semiconductors are the brains of modern electronics.

KOMEG offer temperature and humidity testing chambers that aid in determining reliability of the product
based on rigorous conditions it may be prone to due to temperature conditions.

Industrial classification

a.

Semiconductor industry

It is used in the core parts of many fields such as computers, servers, mobile phones, wired communications, consumer electronics, and automotive electronics. It can be divided into four categories: analog circuit, microprocessor, logic circuit and memory.
b.

Discrete devices

It mainly includes crystal diodes, triodes, rectifier diodes, power diodes, compound diodes, etc. Discrete devices are widely used in home appliances, green lighting, computers, automotive electronics, network communications, industrial control and other products.
c.

Optoelectronic devices

It is mainly a variety of functional devices made by using light and electricity conversion effects, which can be divided into light devices, light receiving devices, light composite devices, etc., including LED, OLEO, photovoltaic solar energy, etc.
d.

Sensor

Can be divided into physical sensors, chemical sensors, biological sensors and so on. Mainly used in industrial automation, industrial robots, bioengineering and other fields.

Application Products

The following is for reference only and does not serve as inspection standards for related industries (it is also updated with technology iteration tests)

Application object	Test purposes	Test conditions	Guideline
Semiconductor industry	Bias damp heat test	85℃，85%RH，Test time 1000h	JESD22-A101
	Highly Accelerated Stress Test	133℃，85%RH,Bias 250Kpa，Test time 96h	JESD22-A110
	Unbiased Highly Accelerated Stress Test	110℃，85%RH。Test time264h	JESD22-A118
	High pressure cooking test	121℃，100%RH，Test time96h	JESD22-A101
Discrete device	Aging test	≥125℃,Test time48-168h	JESD22-A108
	High temperature reverse bias test	125℃，150℃or175℃,Test time168h，500h，1000h	JESD22-A108
	High temperature grid bias test	150℃or175℃,Test time 500h，1000h	JESD22-A108
	Early failure level testing	Early failure level testing	JESD22-A108-A ElAJED-4701-D101
Optoelectronic devices	High/low temperature operation life cycle test	1000 hours test at 125°C for 4 years, 2000 hours test for 8 years	MIT-STD-883E JESD22-A108-A
	Accelerated Temperature Humidity and Bias Test	85℃，85%RH	JESD22-A101-D
	Highly Accelerated Temperature Humidity and Bias Test	130℃，85%RH,relative pressure	JESD22-A110
	High pressure cooking test	130℃，85%RH,relative pressure	JESD22-A102
Sensor	High and low temperature cycle test	Condition A:-55℃ to 125℃ Condition B:-65℃ to 150℃	MIT-STD-883E JESD22-A104-A
	High and low temperature impact test	Condition A:-55℃ to 125℃ Condition B:-65℃ to 150℃	MIT-STD-883E JESD22-B106
	High temperature storage test	150℃	MIT-STD-883E JESD22-B103
	Soldering heat durability test	Immerse in 260℃ tin basin for 10 seconds	MIT-STD-883E